Defects in Sio2 and related dielectrics :

science and technology /

edited by G. Pacchioni, L. Skuja, D.L. Griscom.

Other Authors: Pacchioni, G., Skuja, L., Griscom, D.L.
Format: BOOKS
Language: English
Published: Dordrecht : Kluwer Academic Publishers, 2000
Subjects: Silical -- Electric -- properties -- Congresses
rystals -- Defects -- Congresses
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MainLB, English Stack (5th Fl.)

Call Number: QD181.S6 D313 2000
Copy 1