Defects in Sio2 and related dielectrics :
science and technology /
edited by G. Pacchioni, L. Skuja, D.L. Griscom.
| Other Authors: | Pacchioni, G., Skuja, L., Griscom, D.L. |
|---|---|
| Format: | BOOKS |
| Language: | English |
| Published: |
Dordrecht : Kluwer Academic Publishers, 2000 |
| Subjects: |
Silical -- Electric -- properties -- Congresses
rystals -- Defects -- Congresses |
| Tags: |
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| Physical Description: |
viii, 624 p. |
|---|---|
| Bibliography: |
Includes bibliograpical refernces and index. |
| ISBN: |
0792366859 |